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1 article(s) from Shenouda, Shenouda S

Pd thin films by secondary neutral mass spectrometry

Gábor Y. Molnár,
Shenouda S. Shenouda,
Gábor L. Katona,
Gábor A. Langer and
Dezső L. Beke

Beilstein J. Nanotechnol. 2016, 7, 474–483, doi:10.3762/bjnano.7.41

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Figure 1: Concentration–depth profile in Ag(15 nm)/Au(15 nm) bilayer; as deposited and annealed at 170 °C.

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Figure 2: Average concentration of Au and Ag inside the Ag (a) and Au (b) layers, respectively, versus the an...

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Figure 3: Concentration–depth profile of a Ag(15 nm)/Pd(15 nm) bilayer; as deposited and annealed at 150 °C.

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Figure 4: Comparison of depth profiles obtained after 8 h of heat treatment 150 °C. (a) Ag(15 nm)/Pd(15 nm)/s...

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Figure 5: Saturation concentration of Pd and Ag inside the Ag and Pd layers, respectively, versus the anneali...

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Figure 6: Depth profiles of Ag(15 nm)/Au(15 nm) (a) and Au(15 nm)/Ag(15 nm) (b) film systems after 20 h at 17...

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Figure 7: XRD results (a) obtained by using Cu Kα radiation in θ–2θ mode on Ag(15 nm)/Pd(15 nm) after heat tr...

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Figure 8: ln P (P = D_Ag/D_Au) versus 1/T in the Ag/Au system.

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Figure 9: Concentration–depth profile of Ag(27% Au)/Au(31% Ag) bilayer, (a) as-deposited, (b) annealed at 170...

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Published 22 Mar 2016

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